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Ships within 48 hours · Estimated delivery Aug 27 - Sep 1
Width x Thickness 5133 Dumont High Precision
Maximum specimen height between mount surface and closed lid is 16mm (5/8")
Construction
It is not affected by high vacuum conditions and shows no peaks in energy dispersive X-ray microanalysis
50µm and 500µm
ElectriMulti75-G Select Quantity:10 per set Width x Thickness 5133 DumontElectrical, Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample
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